Publikation:
UV absorption mapping as subsurface damage inspection in transparent optical materials
Datum
2020
conference_paper
Cattaneo, H., Botha, R., & Ziolek, C. (2020). UV absorption mapping as subsurface damage inspection in transparent optical materials. Optics and Photonics for Advanced Dimensional Metrology. https://doi.org/10.1117/12.2555715
Zusätzliche Indizierung
| Institution | Eastern Switzerland University of Applied Sciences (OST) |
|---|---|
| Titel | UV absorption mapping as subsurface damage inspection in transparent optical materials |
| Autor:in | |
| Erschienen in | Optics and Photonics for Advanced Dimensional Metrology |
| Konferenzort | Online Only, France |
| Verlag / Hrsg. Institution | SPIE |
| Datum der Veröffentlichung | 2020 |
Metriken
Zitationen
